SAME54P20A Test Project
Data Fields
CAN_TEST_Type Union Reference

Data Fields

struct {
   uint32_t   __pad0__:4
 
   uint32_t   LBCK:1
 
   uint32_t   TX:2
 
   uint32_t   RX:1
 
   uint32_t   __pad1__:24
 
bit
 
uint32_t reg
 

Detailed Description

Definition at line 152 of file can.h.

Field Documentation

◆ __pad0__

uint32_t CAN_TEST_Type::__pad0__

bit: 0.. 3 Reserved

Definition at line 154 of file can.h.

◆ __pad1__

uint32_t CAN_TEST_Type::__pad1__

bit: 8..31 Reserved

Definition at line 158 of file can.h.

◆ bit

struct { ... } CAN_TEST_Type::bit

Structure used for bit access

◆ LBCK

uint32_t CAN_TEST_Type::LBCK

bit: 4 Loop Back Mode

Definition at line 155 of file can.h.

◆ reg

uint32_t CAN_TEST_Type::reg

Type used for register access

Definition at line 160 of file can.h.

◆ RX

uint32_t CAN_TEST_Type::RX

bit: 7 Receive Pin

Definition at line 157 of file can.h.

◆ TX

uint32_t CAN_TEST_Type::TX

bit: 5.. 6 Control of Transmit Pin

Definition at line 156 of file can.h.


The documentation for this union was generated from the following file: